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[IEEE Proceedings. 2005 IEEE Networking, Sensing and Control, 2005. - Tucson, AZ, USA (March 19-22, 2005)] Proceedings. 2005 IEEE Networking, Sensing and Control, 2005. - Two-layer competitive Hopfield neural network for wafer defect detection

โœ Scribed by Chuan-Yu Chang, ; Si-Yan Lin, ; Mu Der Jeng,


Book ID
126701239
Publisher
IEEE
Year
2005
Weight
903 KB
Category
Article
ISBN-13
9780780388123

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