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[IEEE [Proceedings] 1992 IEEE International Symposium on Circuits and Systems - San Diego, CA, USA (3-6 May 1992)] [Proceedings] 1992 IEEE International Symposium on Circuits and Systems - Analysis and measurement of nonlinear effects in power amplifiers caused by thermal power feedback

✍ Scribed by Schurack, E.; Rupp, W.; Latzel, T.; Gottwald, A.

Book ID: 125544169
Publisher: IEEE
Year: 1992
Weight: 336 KB
Volume: 2
Category: Article
ISBN-13: 9780780305939
DOI: 10.1109/ISCAS.1992.230111

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