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[IEEE NAECON 2011 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2011.07.20-2011.07.22)] Proceedings of the 2011 IEEE National Aerospace and Electronics Conference (NAECON) - Measuring the worthiness of situation assessment

✍ Scribed by Blasch, Erik P.; Salerno, John J.; Tadda, George P.

Book ID: 121389626
Publisher: IEEE
Year: 2011
Weight: 830 KB
Category: Article
ISBN: 1457710390
DOI: 10.1109/NAECON.2011.6183083

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