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[IEEE NAECON 2009 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2009.07.21-2009.07.23)] Proceedings of the IEEE 2009 National Aerospace & Electronics Conference (NAECON) - Stimulus generator for SEIR method based ADC BIST

✍ Scribed by Duan, Jingbo; Vasan, Bharath; Zhao, Chen; Chen, Degang; Geiger, Randall

Book ID: 115508781
Publisher: IEEE
Year: 2009
Weight: 995 KB
Volume: 0
Category: Article
ISBN: 1424444942
DOI: 10.1109/naecon.2009.5426617

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