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[IEEE Multimedia and Expo, 2007 IEEE International Conference on - Beijing, China (2007.07.2-2007.07.5)] Multimedia and Expo, 2007 IEEE International Conference on - A Survey on Digital Camera Image Forensic Methods

✍ Scribed by Van Lanh, Tran; Chong, Kai-Sen; Emmanuel, Sabu; Kankanhalli, Mohan S

Book ID: 125885851
Publisher: IEEE
Year: 2007
Weight: 153 KB
Category: Article
ISBN-13: 9781424410170
DOI: 10.1109/ICME.2007.4284575

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