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[IEEE Microsystems (ASDAM) - Smolenice, Slovakia (2010.10.25-2010.10.27)] The Eighth International Conference on Advanced Semiconductor Devices and Microsystems - Radiation effects on CMOS Image Sensors due to X-Rays

✍ Scribed by Tan, Jiaming; Buttgen, Bern; Theuwissen, Albert J. P.

Book ID: 120545150
Publisher: IEEE
Year: 2010
Weight: 213 KB
Category: Article
ISBN: 1424485746
DOI: 10.1109/ASDAM.2010.5667007

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