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[IEEE Melecon 2010 - 2010 15th IEEE Mediterranean Electrotechnical Conference - Valletta, Malta (2010.04.26-2010.04.28)] Melecon 2010 - 2010 15th IEEE Mediterranean Electrotechnical Conference - Risk sensitivity of failure rate and maintenance expenditure: application of VaR metrics in risk management

โœ Scribed by Schreiner, Andrej; Balzer, Gerd; Precht, Armin


Book ID
111905371
Publisher
IEEE
Year
2010
Weight
528 KB
Volume
0
Category
Article
ISBN
1424457939

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