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[IEEE IVMC '95. Eighth International Vacuum Microelectronics Conference. Technical Digest (Cat. No.TH8012) - Portland, OR, USA (30 July-3 Aug. 1995)] IVMC '95. Eighth International Vacuum Microelectronics Conference. Technical Digest (Cat. No.TH8012) - Modeling of thermal effects in silicon field emitters

✍ Scribed by Ancona, M.G.

Book ID: 115484215
Publisher: IEEE
Year: 1995
Weight: 475 KB
Volume: 0
Category: Article
ISBN-13: 9780780321434
DOI: 10.1109/ivmc.1995.486990

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