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[IEEE IVESC 2004. The 5th International Vacuum Electron Sources - Beijing, China (6-10 Sept. 2004)] IVESC 2004. The 5th International Vacuum Electron Sources Conference Proceedings (IEEE Cat. No.04EX839) - The study of traveling-wave tube cold-test characteristics by three-dimensional simulation code

✍ Scribed by Zhaojun Zhu, ; Baofu Jia, ; Zhengxiang Luo,

Book ID: 118020324
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 148 KB
Volume: 0
Category: Article
ISBN-13: 9780780384378
DOI: 10.1109/ivesc.2004.1414266

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