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[IEEE ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems - San Diego, CA, USA (30 May-1 June 2002)] ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.02CH37258) - Temperature control during test and burn-in

✍ Scribed by Gardell, D.

Book ID: 126721672
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 763 KB
Category: Article
ISBN-13: 9780780371521
DOI: 10.1109/ITHERM.2002.1012514

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