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[IEEE ISSCC. 2005 IEEE International Digest of Technical Papers. Solid-State Circuits Conference, 2005. - San Francisco, CA, USA (Feb. 6-10, 2005)] ISSCC. 2005 IEEE International Digest of Technical Papers. Solid-State Circuits Conference, 2005. - A sheet-type scanner based on a 3D stacked organic-transistor circuit with double word-line and double bit-line structure

✍ Scribed by Kawaguchi, H.; Iba, S.; Kato, Y.; Sekitani, T.; Someya, T.; Sakurai, T.

Book ID: 120819973
Publisher: IEEE
Year: 2005
Weight: 404 KB
Category: Article
ISBN-13: 9780780389045
DOI: 10.1109/ISSCC.2005.1494128

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