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[IEEE ISIE '97 Proceeding of the IEEE International Symposium on Industrial Electronics - Guimaraes, Portugal (7-11 July 1997)] ISIE '97 Proceeding of the IEEE International Symposium on Industrial Electronics - Real time defect detection using image segmentation

✍ Scribed by Miteran, J.; Geveaux, P.; Bailly, R.; Gorria, P.

Book ID: 126652625
Publisher: IEEE
Year: 1997
Weight: 551 KB
Volume: 2
Category: Article
ISBN-13: 9780780339361
DOI: 10.1109/ISIE.1997.649082

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