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[IEEE ISCAS'95 - International Symposium on Circuits and Systems - Seattle, WA, USA (28 April-3 May 1995)] Proceedings of ISCAS'95 - International Symposium on Circuits and Systems - A new approach for the selection of test points for fault diagnosis

โœ Scribed by El-Gamal, M.A.; Hassan, A.S.O.; Abdel-Malek, H.L.


Book ID
126676016
Publisher
IEEE
Year
1995
Tongue
English
Weight
395 KB
Volume
3
Category
Article
ISBN-13
9780780325708

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