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[IEEE ISCAS 2003. International Symposium on Circuits and Systems - Bangkok, Thailand (25-28 May 2003)] Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03. - A modular test structure for CMOS mismatch characterization

✍ Scribed by Conti, M.; Crippa, P.; Fedecostante, F.; Orcioni, S.; Ricciardi, F.; Turchetti, C.; Vendrame, L.

Book ID: 126735929
Publisher: IEEE
Year: 2003
Weight: 286 KB
Volume: 5
Category: Article
ISBN-13: 9780780377615
DOI: 10.1109/ISCAS.2003.1206376

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