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[IEEE (ISATP 2005). The 6th IEEE International Symposium on Assembly and Task Planning: From Nano to Macro Assembly and Manufacturing, 2005. - Montreal, Quebec, Canada (July 19-21, 2005)] (ISATP 2005). The 6th IEEE International Symposium on Assembly and Task Planning: From Nano to Macro Assembly and Manufacturing, 2005. - Determining optimum and suboptimum disassembly sequences with an application to a cell phone

✍ Scribed by Lambert, A.J.D.; Gupta, S.M.

Book ID: 126631882
Publisher: IEEE
Year: 2005
Weight: 351 KB
Category: Article
ISBN-13: 9780780390805
DOI: 10.1109/ISATP.2005.1511483

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