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[IEEE ISA/IEEE Sensors for Industry Conference, 2004. - New Orleans, LA, USA (27-29 Jan. 2004)] ISA/IEEE Sensors for Industry Conference, 2004. Proceedings the - Comparison of measurement results and simulations based on finite element method for an electrical capacitance tomography system

✍ Scribed by Holler, G.; Fuchs, A.; Schweighofer, B.; Brasseur, G.

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