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[IEEE ISAF '92: Eighth IEEE International Symposium on Applications of Ferroelectrics - Greenville, SC, USA (30 Aug.-2 Sept. 1992)] ISAF '92: Proceedings of the Eighth IEEE International Symposium on Applications of Ferroelectrics - Defect structures and fatigue in ferroelectric PZT thin films

✍ Scribed by Wu, Z.; Sayer, M.

Book ID: 126695148
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 515 KB
Category: Article
ISBN-13: 9780780304659
DOI: 10.1109/ISAF.1992.300675

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