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[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - BIST and fault insertion re-use in telecom systems

✍ Scribed by Dikic, S.; Fritz, L.-J.; Dell'Aquia, D.

Book ID: 126676898
Publisher: IEEE
Year: 2001
Weight: 710 KB
Category: Article
ISBN-13: 9780780371699
DOI: 10.1109/TEST.2001.966726

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