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[IEEE International Symposium on Electromagnetic Compatibility (EMC'98) - Denver, CO, USA (24-28 Aug. 1998)] 1998 IEEE EMC Symposium. International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.98CH36253) - Source selection criteria for FDTD models

✍ Scribed by Brench, C.E.; Ramahi, O.M.

Book ID: 120224983
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 330 KB
Volume: 1
Category: Article
ISBN-13: 9780780350151
DOI: 10.1109/ISEMC.1998.750142

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