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[IEEE International Symposium on Electromagnetic Compatibility - Boston, MA, USA (18-22 Aug. 2003)] 2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) - Magnetic near-field distribution measurements over finite meander circuit patterns by fiber-optic magneto-optic probe

โœ Scribed by Iwanami, M.; Hoshino, S.; Kishi, M.; Tsuchiya, M.


Book ID
118117748
Publisher
IEEE
Year
2003
Tongue
English
Weight
403 KB
Edition
2003
Volume
1
Category
Article
ISBN-13
9780780378353

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