[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - Ultra high speed SiGe NPN for advanced BiCMOS technology

[IEEE International Electron Devices Mee

✍ Yi, J.H.; Kim, W.S.; Song, S.; Khang, Y.; Kim, H.-J.; Choi, J.H.; Lim, H.H.; Lee 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 567 KB

[IEEE International Electron Devices Mee

✍ Yang-Kyu Choi, ; Lindert, N.; Peiqi Xuan, ; Tang, S.; Daewon Ha, ; Anderson, E.; 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 596 KB

[IEEE International Electron Devices Mee

✍ Min Yang, ; Schaub, J.; Rogers, D.; Ritter, M.; Rim, K.; Welser, J.; Byeongju Pa 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 477 KB

[IEEE International Electron Devices Mee

✍ Mochida, Y.; Takano, T.; Gambe, H. 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 947 KB

[IEEE International Electron Devices Mee

✍ Bin Yu, ; Haihong Wang, ; Joshi, A.; Qi Xiang, ; Effiong Ibok, ; Ming-Ren Lin, 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 300 KB

[IEEE International Electron Devices Mee

✍ Ng, K.K.; Rafferty, C.S.; Hong-Ih Cong, 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 300 KB