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[IEEE International Electron Devices Meeting. Technical Digest - San Francisco, CA, USA (8-11 Dec. 1996)] International Electron Devices Meeting. Technical Digest - Multilevel flash cells and their trade-offs

✍ Scribed by Eitan, B.; Kazerounian, R.; Roy, A.; Crisenza, G.; Cappelletti, P.; Modelli, A.

Book ID: 121341074
Publisher: IEEE
Year: 1996
Weight: 508 KB
Category: Article
ISBN-13: 9780780333932
DOI: 10.1109/IEDM.1996.553147

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