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[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Influence of quantum confinement effects on single electron and single hole transistors

✍ Scribed by Ishikuro, H.; Hiramoto, T.

Book ID: 126623378
Publisher: IEEE
Year: 1998
Weight: 430 KB
Category: Article
ISBN-13: 9780780347748
DOI: 10.1109/IEDM.1998.746293

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