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[IEEE International Conference on Nanoscience, Engineering and Technology (ICONSET 2011) - Chennai (2011.11.28-2011.11.30)] International Conference on Nanoscience, Engineering and Technology (ICONSET 2011) - Optical characterization of nanostructured silver thin films studied by spectroscopic ellipsometry

✍ Scribed by Sundari, S. Tripura; Dash, S.; Tyagi, A. K.

Book ID: 120610718
Publisher: IEEE
Year: 2011
Weight: 702 KB
Category: Article
ISBN: 146730073X
DOI: 10.1109/ICONSET.2011.6168027

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