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[IEEE International Conference on Microwave and Millimeter Wave Technology - Beijing, China (14-16 Sept. 2000)] ICMMT 2000. 2000 2nd International Conference on Microwave and Millimeter Wave Technology Proceedings (Cat. No.00EX364) - A comparative study of reliability of GaAs MESFETs with TiAl and TiPtAu gate at elevated temperature and high current density

✍ Scribed by Zhang Wan-Rong, ; Li Zhi-Guo, ; Gao Yu-Zhen, ; Cheng Yao-Hai, ; Sun Ying-Hua, ; Chen Jian-Xin, ; Shen Guang-Di,

Book ID: 126633823
Publisher: IEEE
Year: 2000
Weight: 310 KB
Category: Article
ISBN-13: 9780780357433
DOI: 10.1109/ICMMT.2000.895629

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