[IEEE International Conference on Microelectronics - Nis, Serbia (12-14 Sept. 1995)] Proceedings of International Conference on Microelectronics - Relaxation mechanisms in 2D electron gas and origin of 1/f noise in HEMT's

✍ Scribed by Mihaila, M.; Heedt, C.; Tegude, F.G.

• Book ID: 120830500
• Publisher: IEEE
• Year: 1995
• Weight: 618 KB
• Volume: 1
• Category: Article
• ISBN-13: 9780780327863
• DOI: 10.1109/ICMEL.1995.500908