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[IEEE International Conference on Microelectronics - Nis, Serbia (12-14 Sept. 1995)] Proceedings of International Conference on Microelectronics - Relaxation mechanisms in 2D electron gas and origin of 1/f noise in HEMT's

โœ Scribed by Mihaila, M.; Heedt, C.; Tegude, F.G.


Book ID
120830500
Publisher
IEEE
Year
1995
Weight
618 KB
Volume
1
Category
Article
ISBN-13
9780780327863

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