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[IEEE International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. - Gdynia, Poland (22-24 June 2006)] Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. - Probabilistic Testability Measure Before Pseudorandom Test Generation

✍ Scribed by Kaminska, M.O.; Kulak, E.N.; Guz, O.A.; Yeliseev, V.V.

Book ID: 126737713
Publisher: IEEE
Year: 2006
Weight: 204 KB
Category: Article
ISBN-13: 9788392263227
DOI: 10.1109/MIXDES.2006.1706649

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