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[IEEE International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. - Gdynia, Poland (22-24 June 2006)] Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. - A Measurement Technique To Obtain The Delay Time Of A Comparator In 120nm CMOS

✍ Scribed by Goll, B.; Durante, M.S.; Zimmermann, H.

Book ID: 115541733
Publisher: IEEE
Year: 2006
Weight: 676 KB
Volume: 0
Category: Article
ISBN-13: 9788392263227
DOI: 10.1109/mixdes.2006.1706643

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