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[IEEE Intermag Europe 2002 Digest of Technical Papers. 2002 IEEE International Magnetics Conference - Amsterdam, Netherlands (28 April-2 May 2002)] IEEE International Digest of Technical Papers on Magnetics Conference - Sub-micron scale MOKE measurement system

✍ Scribed by Lancarotte, M.S.; Schoenmaker, J.; Nobrega, L.N.; Souche, Y.; Santos, A.D.

Book ID: 125438684
Publisher: IEEE
Year: 2002
Weight: 112 KB
Category: Article
ISBN-13: 9780780373655
DOI: 10.1109/intmag.2002.1001105

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