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[IEEE INTELEC 26th Annual International Telecommunications Energy Conference - Chicago, IL, USA (19-23 Sept. 2004)] 2004 10th International Workshop on Computational Electronics (IEEE Cat. No.04EX915) - Failures of MOSFETs in terrestrial power electronics due to single event burnout

✍ Scribed by Davidson, C.D.; Blackmore, E.W.; Hess, J.I.

Book ID: 115471676
Publisher: IEEE
Year: 2004
Weight: 503 KB
Volume: 0
Category: Article
ISBN-13: 9780780384583
DOI: 10.1109/intlec.2004.1401516

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