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[IEEE Instruments (ICEMI) - Chengdu, China (2011.08.16-2011.08.19)] IEEE 2011 10th International Conference on Electronic Measurement & Instruments - Application of SIFT feature extraction algorithm on the image registration

✍ Scribed by Liu Jinxia, ; Qiu Yuehong,

Book ID: 120565488
Publisher: IEEE
Year: 2011
Weight: 242 KB
Category: Article
ISBN: 1424481589
DOI: 10.1109/ICEMI.2011.6037882

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