๐”– Bobbio Scriptorium
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[IEEE Instruments (ICEMI) - Beijing, China (2009.08.16-2009.08.19)] 2009 9th International Conference on Electronic Measurement & Instruments - Simulation analysis of sensitivity for electrical capacitance tomography

โœ Scribed by Pei, Tian; Wang, Wenliang


Book ID
120083936
Publisher
IEEE
Year
2009
Weight
170 KB
Category
Article
ISBN
1424438632

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