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[IEEE Innovation in Technology Management. The Key to Global Leadership. PICMET '97 - Portland, OR, USA (27-31 July 1997)] Innovation in Technology Management. The Key to Global Leadership. PICMET '97 - Rapid application development: major issues and lessons learned

✍ Scribed by Vasudevan, S.; Wilemon, D.

Book ID: 126850263
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 62 KB
Category: Article
ISBN-13: 9780780335745
DOI: 10.1109/picmet.1997.653483

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