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[IEEE IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics - Budapest, Hungary (21-23 May 2001)] IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188) - An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy

โœ Scribed by Bechou, L.; Dallet, D.; Danto, Y.; Daponte, P.; Ousten, Y.; Rapuano, S.


Book ID
120834847
Publisher
IEEE
Year
2001
Tongue
English
Weight
597 KB
Volume
1
Category
Article
ISBN-13
9780780366466

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