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[IEEE IGARSS 2010 - 2010 IEEE International Geoscience and Remote Sensing Symposium - Honolulu, HI, USA (2010.07.25-2010.07.30)] 2010 IEEE International Geoscience and Remote Sensing Symposium - Classification of hyperspectral images with Extended Attribute Profiles and feature extraction techniques

✍ Scribed by Dalla Mura, Mauro; Benediktsson, Jon Atli; Bruzzone, Lorenzo

Book ID: 121671970
Publisher: IEEE
Year: 2010
Weight: 192 KB
Category: Article
ISBN: 1424495652
DOI: 10.1109/IGARSS.2010.5652469

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