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[IEEE IGARSS 2010 - 2010 IEEE International Geoscience and Remote Sensing Symposium - Honolulu, HI, USA (2010.07.25-2010.07.30)] 2010 IEEE International Geoscience and Remote Sensing Symposium - Reflectivity studies of passive microwave calibration targets and absorptive materials

✍ Scribed by Gu, Dazhen; Cox, Amanda E.; Houtz, Derek; Walker, David K.; Randa, James; Billinger, Robert L.

Book ID: 120536688
Publisher: IEEE
Year: 2010
Weight: 239 KB
Category: Article
ISBN: 1424495652
DOI: 10.1109/IGARSS.2010.5653688

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