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[IEEE IGARSS 2010 - 2010 IEEE International Geoscience and Remote Sensing Symposium - Honolulu, HI, USA (2010.07.25-2010.07.30)] 2010 IEEE International Geoscience and Remote Sensing Symposium - Use of the merged dual-frequency radar altimeter backscatter data over China land surface

โœ Scribed by Yang, Le; Du, Hejuan; Ma, Hongzhang; Liu, Qinhuo


Book ID
118261184
Publisher
IEEE
Year
2010
Weight
595 KB
Volume
0
Category
Article
ISBN
1424495652

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