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[IEEE IEEE/PES Transmission and Distribution Conference - Chicago, IL, USA (10-15 April 1994)] Proceedings of IEEE/PES Transmission and Distribution Conference - The comparison of test circuits with arc models

โœ Scribed by van der Sluis, L.; Rutgers, W.R.


Book ID
121724282
Publisher
IEEE
Year
1994
Tongue
English
Weight
405 KB
Category
Article
ISBN-13
9780780318830

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