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[IEEE IEEE/OES Seventh Working Conference on Current Measurement Technology, 2003. - San Diego, CA, USA (March 13-15, 2003)] Proceedings of the IEEE/OES Seventh Working Conference on Current Measurement Technology, 2003. - Non-uniform sampling issues arising in shallow angle wave profiling LIDAR

✍ Scribed by Belmont, M.R.; Horwood, I.M.K.; Thurley, R.W.F.

Book ID: 126641545
Publisher: IEEE
Year: 2003
Weight: 269 KB
Category: Article
ISBN-13: 9780780378131
DOI: 10.1109/CCM.2003.1194300

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