๐”– Bobbio Scriptorium
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[IEEE IEEE Ultrasonics Symposium - Baltimore, MD, USA (31 Oct.-3 Nov. 1993)] Proceedings of IEEE Ultrasonics Symposium - Complex analysis of reflection coefficient for the characterization of layered materials using a line-focus-beam acoustic microscope

โœ Scribed by Tsukahara, Y.; Neron, C.; Jen, C.K.; Kushibiki, J.


Book ID
121388380
Publisher
IEEE
Year
1993
Weight
430 KB
Category
Article
ISBN-13
9780780312784

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