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[IEEE IEEE Systems Man and Cybernetics Conference - SMC - Le Touquet, France (17-20 Oct. 1993)] Proceedings of IEEE Systems Man and Cybernetics Conference - SMC - Identification of system failure causes using bond graph models

โœ Scribed by Kohda, T.; Katsube, H.; Fujihara, H.; Inoue, K.


Book ID
125417405
Publisher
IEEE
Year
1993
Weight
503 KB
Category
Article
ISBN-13
9780780309111

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