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[IEEE IEEE Symposium on Ultrasonics, 2003 - Honululu, HI, USA (Oct. 5-8, 2003)] IEEE Symposium on Ultrasonics, 2003 - Pressure sensitivity of Rayleigh and Sezawa wave in ZnO/Si[001] structures

โœ Scribed by Talbi, A.; Sarry, F.; Le Brizoual, L.; Elhakiki, M.; Elmazria, O.; Alnot, P.


Book ID
120648790
Publisher
IEEE
Year
2003
Tongue
English
Weight
253 KB
Volume
2
Category
Article
ISBN-13
9780780379220

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