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[IEEE IEEE Sensors, 2005. - Irvine, CA, USA (Oct. 31, 2005)] IEEE Sensors, 2005. - Absolute Pitch, Roll and Yaw Measurement on CMOS

✍ Scribed by Chaehoi, A.; Dumas, N.; Mailly, F.; Latorre, L.; Nouet, P.

No coin nor oath required. For personal study only.

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