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[IEEE IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 - San Francisco, CA (JUNE 11-13, 2006)] IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 - An Analytical Method to Determine MOSFET~s High Frequency Noise Parameters from 50-~ Noise Figure Measurements

✍ Scribed by Asgaran, S.; Deen, M.J.; Chih-Hung Chen,

Book ID: 120158076
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 268 KB
Category: Article
ISBN-13: 9780780395725
DOI: 10.1109/RFIC.2006.1651151

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