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[IEEE IEEE Power Engineering Society General Meeting, 2005 - San Francisco, CA, USA (June 12-16, 2005)] IEEE Power Engineering Society General Meeting, 2005 - Deficiency of the IEC flicker meter for measuring interharmonic-caused voltage flickers

โœ Scribed by Xu, W.


Book ID
121243263
Publisher
IEEE
Year
2005
Weight
900 KB
Category
Article
ISBN-13
9780780391574

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