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[IEEE IEEE Power Engineering Society General Meeting, 2005 - San Francisco, CA, USA (June 12-16, 2005)] IEEE Power Engineering Society General Meeting, 2005 - Effect of low voltage ride through (LVRT) characteristic on voltage stability

✍ Scribed by Abbey, C.; Joos, G.

Book ID: 120766716
Publisher: IEEE
Year: 2005
Weight: 1007 KB
Category: Article
ISBN-13: 9780780391574
DOI: 10.1109/PES.2005.1489659

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