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[IEEE IEEE MTT/ED/AP/LEO Societies Joint Chapter United Kingdom and Republic of Ireland Section. 1997 Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications EDMO - London, UK (24-25 Nov. 1997)] IEEE MTT/ED/AP/LEO Societies Joint Chapter United Kingdom and Republic of Ireland Section. 1997 Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO (Cat. No.97TH8305) - Two-dimensional analysis of gate-lag phenomena in recessed-gate GaAs MESFETs

✍ Scribed by Horio, K.; Yamada, T.

Book ID: 111657844
Publisher: IEEE
Year: 1997
Weight: 499 KB
Volume: 0
Category: Article
ISBN-13: 9780780341357
DOI: 10.1109/edmo.1997.668207

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[IEEE IEEE MTT/ED/AP/LEO Societies Joint

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