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[IEEE IEEE MTT-S International Microwave Symposium - IMS 2003 - Philadelphia, PA, USA (8-13 June 2003)] IEEE MTT-S International Microwave Symposium Digest, 2003 - CAD identification and validation of a non-linear dynamic model for performance analysis of large-signal amplifiers

✍ Scribed by Florian, C.; Filicori, F.; Mirri, D.; Brazil, T.; Wren, M.

Book ID: 121473445
Publisher: IEEE
Year: 2003
Weight: 307 KB
Volume: 3
Category: Article
ISBN-13: 9780780376953
DOI: 10.1109/MWSYM.2003.1210582

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