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[IEEE IEEE MTT-S International Microwave Symposium - IMS 2003 - Philadelphia, PA, USA (8-13 June 2003)] IEEE MTT-S International Microwave Symposium Digest, 2003 - De-embedding of port discontinuities in full-wave CAD models of multi-port circuits

✍ Scribed by Okhmatovski, V.I.; Morsey, J.; Cangellaris, A.C.

Book ID: 118203382
Publisher: IEEE
Year: 2003
Weight: 249 KB
Volume: 1
Category: Article
ISBN-13: 9780780376953
DOI: 10.1109/mwsym.2003.1210939

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