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[IEEE IEEE MTT-S International Microwave Symposium Digest - Long Beach, CA, USA (13-15 June 1989)] IEEE MTT-S International Microwave Symposium Digest - Modeling of noise parameters of MESFETs and MODFETs and their frequency and temperature dependence

✍ Scribed by Pospieszalski, M.W.

Book ID: 125834841
Publisher: IEEE
Year: 1989
Weight: 276 KB
Category: Article
DOI: 10.1109/MWSYM.1989.38745

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